Effets de la concentration des défauts sur la surface d'énergie potentielle du silicium amorphe

Kallel, Houssem

dc.contributor.advisor	Mousseau, Normand	fr
dc.contributor.author	Kallel, Houssem	fr
dc.date.accessioned	2012-05-28T13:55:41Z
dc.date.available	2012-05-28T13:55:41Z
dc.date.issued	2008-08-07	fr
dc.date.submitted	2008	fr
dc.identifier.uri	http://hdl.handle.net/1866/8027
dc.subject	Silicium amorphe	fr
dc.subject	Relaxation	fr
dc.subject	Structure	fr
dc.subject	Défauts de liaison	fr
dc.subject	Surface d'énergie potentielle	fr
dc.subject	Nano-calorimétrie différentielle à balayage	fr
dc.subject	Amorphous silicon	fr
dc.subject	Relaxation	fr
dc.subject	Structure	fr
dc.subject	Radial distribution function	fr
dc.subject	Bond defects	fr
dc.subject	Potential energy surface	fr
dc.subject	Differential scanning nano-calorimetry	fr
dc.title	Effets de la concentration des défauts sur la surface d'énergie potentielle du silicium amorphe	fr
dc.type	Thèse ou mémoire / Thesis or Dissertation	fr
etd.degree.discipline	Physique	fr
etd.degree.grantor	Université de Montréal	fr
etd.degree.level	Maîtrise / Master's	fr
etd.degree.name	M. Sc.	fr
dcterms.description	Mémoire numérisé par la Division de la gestion de documents et des archives de l'Université de Montréal.	fr
dcterms.language	fra	fr

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