Parcourir Faculté des arts et des sciences par auteur·e "Lussier, Alexandre W."
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Raman-based mapping and depth-profiling of the relaxation state in amorphous silicon
Lussier, Alexandre W.; Bourbonnais Sureault, David; Chicoine, Martin; Martel, Richard; Martinu, Ludvik; Roorda, Sjoerd; Schiettekatte, François (American Institute of Physics, 2024-02-09)We show that the micro-scale variations in the relaxation state of amorphous silicon (aSi) can be well-identified by Raman mapping over hundreds or thousands of µm2 in 1-2 hours. Pure and relaxed a-Si is obtained by self-implantation in crystalline ... -
Zirconia-titania-doped tantala optical coatings for low mechanical loss Bragg mirrors
Lalande, Émile; Lussier, Alexandre W.; Lévesque, Carl; Ward, Marianne; Baloukas, Bill; Martinu, Ludvik; Gabriele, Vajente; Billingsley, Garilynn; Ananyeva, Alena; Bassiri, Riccardo; Fejer, Martin M.; Schiettekatte, François (American Vacuum Society, 2021-06-10)The noise caused by internal mechanical dissipation in the high refractive index amorphous thin films in dielectric mirrors is an important limitation for gravitational wave detection. The objective of this study is to decrease this noise spectral ...